• DocumentCode
    2510569
  • Title

    Simulation Study on an Ultra-High Resolution SPECT with CdTe Detectors

  • Author

    Ogawa, Koichi ; Muraishi, Masaaki

  • Author_Institution
    Dept. of Electron. Informatics, Hosei Univ., Tokyo
  • Volume
    4
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    2421
  • Lastpage
    2425
  • Abstract
    The development of semiconductor detectors such as CdTe and CdZnTe which work at room temperature enables us to realize a new SPECT system. These semiconductor detectors have a high energy resolution. Moreover, they are used as pixelated detectors, and so the intrinsic resolution can be equal to the pixel size used for measurement. The size of a detector pixel is as small as 1 mm, so that the spatial resolution of a reconstructed SPECT image can establish less than 3mm FWHM. To clarify the feasibility of an ultra-high resolution SPECT system, we conducted some simulations and evaluated the image quality.
  • Keywords
    II-VI semiconductors; cadmium compounds; semiconductor counters; single photon emission computed tomography; tellurium compounds; CdTe; SPECT; semiconductor detectors; single photon emission computed tomography; Charge carrier processes; Collimators; Costs; Energy resolution; Nuclear and plasma sciences; Scintillation counters; Single photon emission computed tomography; Solid scintillation detectors; Spatial resolution; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.354401
  • Filename
    4179515