DocumentCode
2510585
Title
Outdoor stability performance of single and tandem amorphous silicon modules
Author
Mrig, L. ; Rummel, S. ; Waddington, D. ; DeBlasio, R.
Author_Institution
Solar Energy Res. Inst., Golden, CO, USA
fYear
1988
fDate
1988
Firstpage
1221
Abstract
Stability performance test results are presented for tests conducted at SERI on single and tandem amorphous silicon solar cell modules and submodules made by various manufacturers. Two sets of commercially available first-generation single-junction amorphous silicon solar cell modules manufactured by two different manufacturers, one single-junction submodule fabricated under a SERI subcontract, and one tandem amorphous silicon research submodule fabricated by another SERI subcontractor are described. Based on the test data, the efficiency degradation for the two best first-generation single-junction amorphous silicon modules for the test period of three to four years is on the order of 20%.
Keywords
amorphous semiconductors; elemental semiconductors; semiconductor device testing; silicon; solar cells; stability; Si solar cells; amorphous semiconductors; efficiency degradation; modules; semiconductor device testing; stability performance; Amorphous silicon; Circuit testing; Degradation; Electrical resistance measurement; Manufacturing; Photovoltaic cells; Power generation; Pulp manufacturing; Solar power generation; Stability; Subcontracting; Sun; Testing; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location
Las Vegas, NV, USA
Type
conf
DOI
10.1109/PVSC.1988.105899
Filename
105899
Link To Document