• DocumentCode
    2510585
  • Title

    Outdoor stability performance of single and tandem amorphous silicon modules

  • Author

    Mrig, L. ; Rummel, S. ; Waddington, D. ; DeBlasio, R.

  • Author_Institution
    Solar Energy Res. Inst., Golden, CO, USA
  • fYear
    1988
  • fDate
    1988
  • Firstpage
    1221
  • Abstract
    Stability performance test results are presented for tests conducted at SERI on single and tandem amorphous silicon solar cell modules and submodules made by various manufacturers. Two sets of commercially available first-generation single-junction amorphous silicon solar cell modules manufactured by two different manufacturers, one single-junction submodule fabricated under a SERI subcontract, and one tandem amorphous silicon research submodule fabricated by another SERI subcontractor are described. Based on the test data, the efficiency degradation for the two best first-generation single-junction amorphous silicon modules for the test period of three to four years is on the order of 20%.
  • Keywords
    amorphous semiconductors; elemental semiconductors; semiconductor device testing; silicon; solar cells; stability; Si solar cells; amorphous semiconductors; efficiency degradation; modules; semiconductor device testing; stability performance; Amorphous silicon; Circuit testing; Degradation; Electrical resistance measurement; Manufacturing; Photovoltaic cells; Power generation; Pulp manufacturing; Solar power generation; Stability; Subcontracting; Sun; Testing; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
  • Conference_Location
    Las Vegas, NV, USA
  • Type

    conf

  • DOI
    10.1109/PVSC.1988.105899
  • Filename
    105899