Title :
Outdoor stability performance of single and tandem amorphous silicon modules
Author :
Mrig, L. ; Rummel, S. ; Waddington, D. ; DeBlasio, R.
Author_Institution :
Solar Energy Res. Inst., Golden, CO, USA
Abstract :
Stability performance test results are presented for tests conducted at SERI on single and tandem amorphous silicon solar cell modules and submodules made by various manufacturers. Two sets of commercially available first-generation single-junction amorphous silicon solar cell modules manufactured by two different manufacturers, one single-junction submodule fabricated under a SERI subcontract, and one tandem amorphous silicon research submodule fabricated by another SERI subcontractor are described. Based on the test data, the efficiency degradation for the two best first-generation single-junction amorphous silicon modules for the test period of three to four years is on the order of 20%.
Keywords :
amorphous semiconductors; elemental semiconductors; semiconductor device testing; silicon; solar cells; stability; Si solar cells; amorphous semiconductors; efficiency degradation; modules; semiconductor device testing; stability performance; Amorphous silicon; Circuit testing; Degradation; Electrical resistance measurement; Manufacturing; Photovoltaic cells; Power generation; Pulp manufacturing; Solar power generation; Stability; Subcontracting; Sun; Testing; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/PVSC.1988.105899