DocumentCode :
2510625
Title :
The third generation verification technology based SOC debugging
Author :
Ruan, A.W. ; Li, C.Q. ; Song, Z.J. ; Chen, J. ; Deng, L.X. ; Hou, H.C. ; Liao, Y.B.
Author_Institution :
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear :
2011
fDate :
21-23 Oct. 2011
Firstpage :
109
Lastpage :
114
Abstract :
Co-verification technologies are characterized by two inherently conflicting issues: signal observability and simulation performance. To overcome these limitations, we proposed a run-time RTL debugging methodology for FPGA-based co-simulation as well as debugging methodology for a FPGA emulator with testbench synthesis engine. The first method provides internal nodes probing on an event-driven co-simulation platform and achieves full observability for DUT with better simulation performance. In the second method, the proposed testbench synthesis engine is built by hardware constructs in terms of Verilog IEEE Simulation Model to correspond with the testbench. Internal nodes are hardware-wired to DUT top-level during compilation, then sampled continuously by a sample logic into on-chip storage device (e.g. Block RAM, SDRAM and etc). Thus better observability can be achieved without stopping of DUT clock.
Keywords :
field programmable gate arrays; system-on-chip; FPGA emulator; FPGA-based cosimulation; SOC debugging; Verilog IEEE simulation model; coverification technology; event-driven cosimulation platform; on-chip storage device; run-time RTL debugging methodology; signal observability; simulation performance; testbench synthesis engine; third generation verification technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Problem-Solving (ICCP), 2011 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4577-0602-8
Electronic_ISBN :
978-1-4577-0601-1
Type :
conf
DOI :
10.1109/ICCPS.2011.6092213
Filename :
6092213
Link To Document :
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