DocumentCode
2510625
Title
The third generation verification technology based SOC debugging
Author
Ruan, A.W. ; Li, C.Q. ; Song, Z.J. ; Chen, J. ; Deng, L.X. ; Hou, H.C. ; Liao, Y.B.
Author_Institution
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2011
fDate
21-23 Oct. 2011
Firstpage
109
Lastpage
114
Abstract
Co-verification technologies are characterized by two inherently conflicting issues: signal observability and simulation performance. To overcome these limitations, we proposed a run-time RTL debugging methodology for FPGA-based co-simulation as well as debugging methodology for a FPGA emulator with testbench synthesis engine. The first method provides internal nodes probing on an event-driven co-simulation platform and achieves full observability for DUT with better simulation performance. In the second method, the proposed testbench synthesis engine is built by hardware constructs in terms of Verilog IEEE Simulation Model to correspond with the testbench. Internal nodes are hardware-wired to DUT top-level during compilation, then sampled continuously by a sample logic into on-chip storage device (e.g. Block RAM, SDRAM and etc). Thus better observability can be achieved without stopping of DUT clock.
Keywords
field programmable gate arrays; system-on-chip; FPGA emulator; FPGA-based cosimulation; SOC debugging; Verilog IEEE simulation model; coverification technology; event-driven cosimulation platform; on-chip storage device; run-time RTL debugging methodology; signal observability; simulation performance; testbench synthesis engine; third generation verification technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Problem-Solving (ICCP), 2011 International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4577-0602-8
Electronic_ISBN
978-1-4577-0601-1
Type
conf
DOI
10.1109/ICCPS.2011.6092213
Filename
6092213
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