• DocumentCode
    2510625
  • Title

    The third generation verification technology based SOC debugging

  • Author

    Ruan, A.W. ; Li, C.Q. ; Song, Z.J. ; Chen, J. ; Deng, L.X. ; Hou, H.C. ; Liao, Y.B.

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2011
  • fDate
    21-23 Oct. 2011
  • Firstpage
    109
  • Lastpage
    114
  • Abstract
    Co-verification technologies are characterized by two inherently conflicting issues: signal observability and simulation performance. To overcome these limitations, we proposed a run-time RTL debugging methodology for FPGA-based co-simulation as well as debugging methodology for a FPGA emulator with testbench synthesis engine. The first method provides internal nodes probing on an event-driven co-simulation platform and achieves full observability for DUT with better simulation performance. In the second method, the proposed testbench synthesis engine is built by hardware constructs in terms of Verilog IEEE Simulation Model to correspond with the testbench. Internal nodes are hardware-wired to DUT top-level during compilation, then sampled continuously by a sample logic into on-chip storage device (e.g. Block RAM, SDRAM and etc). Thus better observability can be achieved without stopping of DUT clock.
  • Keywords
    field programmable gate arrays; system-on-chip; FPGA emulator; FPGA-based cosimulation; SOC debugging; Verilog IEEE simulation model; coverification technology; event-driven cosimulation platform; on-chip storage device; run-time RTL debugging methodology; signal observability; simulation performance; testbench synthesis engine; third generation verification technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Problem-Solving (ICCP), 2011 International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4577-0602-8
  • Electronic_ISBN
    978-1-4577-0601-1
  • Type

    conf

  • DOI
    10.1109/ICCPS.2011.6092213
  • Filename
    6092213