• DocumentCode
    2510642
  • Title

    Microstrip step discontinuities on single and multilayer dielectric substrates

  • Author

    Singh, Himanshu ; Verma, A.K.

  • Author_Institution
    Dept. of Electron., Sci. Univ. of Delhi, Delhi
  • fYear
    2008
  • fDate
    21-24 Nov. 2008
  • Firstpage
    735
  • Lastpage
    738
  • Abstract
    We present a model on the based of K.C. Gupta proposal for inductance and capacitance for epsivr = 9.6 epsivr = 4.0 respectively for single layer and compare the numerical calibration with de-embedding techniques used in the planar electromagnetic (EM) simulation (SONNET) for epsivr = 2.3, 4.0, 15.1, 20.0 & 40.0. We change the model for multilayer and compare with present model for epsivr = 12.0 and epsivr = 3.5.
  • Keywords
    capacitance; computational electromagnetics; inductance; microstrip lines; capacitance; de-embedding techniques; inductance; microstrip step discontinuities; multilayer dielectric substrates; planar electromagnetic simulation; single dielectric substrates; Capacitance; Chromium; Curve fitting; Data mining; Dielectric substrates; Inductance; Logistics; Microstrip; Multidimensional systems; Nonhomogeneous media; Closed-form model; Microstrip step; Step discontinuity; multidimensional logistic curve fitting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
  • Conference_Location
    Jaipur
  • Print_ISBN
    978-1-4244-2690-4
  • Electronic_ISBN
    978-1-4244-2691-1
  • Type

    conf

  • DOI
    10.1109/AMTA.2008.4763042
  • Filename
    4763042
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2510642