Title :
Microstrip step discontinuities on single and multilayer dielectric substrates
Author :
Singh, Himanshu ; Verma, A.K.
Author_Institution :
Dept. of Electron., Sci. Univ. of Delhi, Delhi
Abstract :
We present a model on the based of K.C. Gupta proposal for inductance and capacitance for epsivr = 9.6 epsivr = 4.0 respectively for single layer and compare the numerical calibration with de-embedding techniques used in the planar electromagnetic (EM) simulation (SONNET) for epsivr = 2.3, 4.0, 15.1, 20.0 & 40.0. We change the model for multilayer and compare with present model for epsivr = 12.0 and epsivr = 3.5.
Keywords :
capacitance; computational electromagnetics; inductance; microstrip lines; capacitance; de-embedding techniques; inductance; microstrip step discontinuities; multilayer dielectric substrates; planar electromagnetic simulation; single dielectric substrates; Capacitance; Chromium; Curve fitting; Data mining; Dielectric substrates; Inductance; Logistics; Microstrip; Multidimensional systems; Nonhomogeneous media; Closed-form model; Microstrip step; Step discontinuity; multidimensional logistic curve fitting;
Conference_Titel :
Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
Conference_Location :
Jaipur
Print_ISBN :
978-1-4244-2690-4
Electronic_ISBN :
978-1-4244-2691-1
DOI :
10.1109/AMTA.2008.4763042
