• DocumentCode
    2510643
  • Title

    Protection of commercial installations from the high-frequency electromagnetic threats of HEMP and IEMI using IEC standards

  • Author

    Radasky, W.A.

  • Author_Institution
    Metatech Corp., Goleta, CA, USA
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    758
  • Lastpage
    761
  • Abstract
    The International Electrotechnical Commission (IEC) has been working for nearly 20 years preparing standards and other publications dealing with the threat of high-altitude electromagnetic pulse (HEMP) from a high-altitude nuclear detonation and the threat of intentional electromagnetic interference (IEMI) produced by electromagnetic weapons used by criminals or terrorists. In addition to establishing the electromagnetic environments for each threat, the IEC has also developed generalized protection and test methods to be used for commercial installations. This paper examines the specific problem of a hypothetical commercial building with external power and communications entering the building; in addition the building is assumed to contain a computer server room that is crucial to the operation of the business. The paper applies the IEC standards for these two threats to illustrate how one could design protection for the building and how one would test to ensure that the protection is adequate.
  • Keywords
    IEC standards; electromagnetic devices; electromagnetic pulse; telecommunication standards; HEMP; IEC standards; IEMI; International Electrotechnical Commission; commercial installation protection; computer server room; high altitude nuclear detonation; high-frequency electromagnetic threats; Buildings; Business communication; EMP radiation effects; Electromagnetic interference; IEC standards; Protection; Standards publication; Terrorism; Testing; Weapons; High Altitude Electromagnetic Pulse (HEMP); High Power Electromagnetics (HPEM); IEC Standards; Installation Protection; Intentional Electromagnetic Interference (IEMI);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475520
  • Filename
    5475520