Characterization of embedded resistors for high frequency wireless applications

This paper analyzes frequency and time domain response of embedded resistors in a multilayered structure using LTCC (low temperature co-fired ceramic) technology and discusses their effect on high frequency operation of mixed signal circuits using them. The results have been compared to TDR (time domain reflectometry) and TDT (time domain transmission) measurements using pulse propagation. Frequency-dependent parasitics are observed to be significant in embedded resistors from measurements and simulations. The importance of accurate modeling including frequency dependence and parasitics is emphasized in this paper for prediction of the frequency behavior of embedded resistors. Macromodels for resistor structures were developed and their simulation results show a good agreement with measurements. This paper also discusses a macromodeling approach that provides good correlation with measurements