Title :
Ageing effect on immunity of a mixed signal IC
Author :
Li, Binhong ; Boyer, Alexandre ; Ben Dhia, S. ; Lemoine, Christophe
Author_Institution :
INSA, Univ. of Toulouse, Toulouse, France
Abstract :
This paper presents an original study aiming at evaluating the drift of susceptibility level of a mixed signal circuit. The paper first addresses the measurement set-ups and the recommendations required to extract susceptibility level variations. Then experimental results are presented and show that the immunity of some blocks of the circuit under test can be significantly reduced after a standard aging procedure.
Keywords :
ageing; mixed analogue-digital integrated circuits; mixed signal IC; mixed signal circuit; standard aging procedure; susceptibility level variations; Accelerated aging; CMOS digital integrated circuits; Circuit testing; Degradation; Electromagnetic compatibility; Electromagnetic radiation; Failure analysis; Immunity testing; Integrated circuit noise; Threshold voltage;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475532
