DocumentCode
2510935
Title
Ageing effect on immunity of a mixed signal IC
Author
Li, Binhong ; Boyer, Alexandre ; Ben Dhia, S. ; Lemoine, Christophe
Author_Institution
INSA, Univ. of Toulouse, Toulouse, France
fYear
2010
fDate
12-16 April 2010
Firstpage
1024
Lastpage
1027
Abstract
This paper presents an original study aiming at evaluating the drift of susceptibility level of a mixed signal circuit. The paper first addresses the measurement set-ups and the recommendations required to extract susceptibility level variations. Then experimental results are presented and show that the immunity of some blocks of the circuit under test can be significantly reduced after a standard aging procedure.
Keywords
ageing; mixed analogue-digital integrated circuits; mixed signal IC; mixed signal circuit; standard aging procedure; susceptibility level variations; Accelerated aging; CMOS digital integrated circuits; Circuit testing; Degradation; Electromagnetic compatibility; Electromagnetic radiation; Failure analysis; Immunity testing; Integrated circuit noise; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5621-5
Type
conf
DOI
10.1109/APEMC.2010.5475532
Filename
5475532
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