DocumentCode :
2511053
Title :
An Image Analysis Approach for Detecting Malignant Cells in Digitized H&E-stained Histology Images of Follicular Lymphoma
Author :
Sertel, O. ; Catalyurek, U.V. ; Lozanski, G. ; Shanaah, A. ; Gurcan, M.N.
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
fYear :
2010
fDate :
23-26 Aug. 2010
Firstpage :
273
Lastpage :
276
Abstract :
The gold standard in follicular lymphoma (FL) diagnosis and prognosis is histopathological examination of tumor tissue samples. However, the qualitative manual evaluation is tedious and subject to considerable inter- and intra-reader variations. In this study, we propose an image analysis system for quantitative evaluation of digitized FL tissue slides. The developed system uses a robust feature space analysis method, namely the mean shift algorithm followed by a hierarchical grouping to segment a given tissue image into basic cytological components. We then apply further morphological operations to achieve the segmentation of individual cells. Finally, we generate a likelihood measure to detect candidate cancer cells using a set of clinically driven features. The proposed approach has been evaluated on a dataset consisting of 100 region of interest (ROI) images and achieves a promising 89% average accuracy in detecting target malignant cells.
Keywords :
feature extraction; image segmentation; maximum likelihood estimation; medical image processing; tumours; clinically driven features; digitized FL tissue slides; feature space analysis method; follicular lymphoma images; hierarchical grouping; histology images; image analysis approach; interreader variation; intrareader variation; likelihood measurement; malignant cell detection; mean shift algorithm; morphological operations; tissue image segmentation; tumor tissue samples; Accuracy; Cancer; Clustering algorithms; Feature extraction; Image analysis; Image color analysis; Image segmentation; cell segmentation; histology; image analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
ISSN :
1051-4651
Print_ISBN :
978-1-4244-7542-1
Type :
conf
DOI :
10.1109/ICPR.2010.76
Filename :
5597591
Link To Document :
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