• DocumentCode
    2511098
  • Title

    FDTD simulation of lightning current along vertical grounding rod appended to a horizontal grounding grid

  • Author

    Chen, Jiaqing ; Zhao, Fei ; Zhou, Shudao ; Hongmei Tian

  • Author_Institution
    Inst. of Meteorol., PLA Univ. of Sci. & Technol., Nanjing, China
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    1478
  • Lastpage
    1481
  • Abstract
    Vertical grounding rods are usually needed to be appended to a horizontal grounding grid to decrease the grounding resistance. When a lightning current flows through a grounding grid appended by some vertical rods, it´s valuable to reasonably arrange these vertical rods to reach an optimum design. In this paper, lightning discharge current distribution among the vertical grounding rods appended to a horizontal grounding grid are numerically calculated by FDTD (finite-difference time-domain) method. The discharge effectiveness of the vertical grounding rod appended at different position is compared. The shielding effect of a horizontal grounding grid to obstruct the lightning current to flow downward is shown. The conclusions obtained will give a reasonable guidance for the formation and reformation of grounding grid.
  • Keywords
    earthing; electromagnetic shielding; finite difference time-domain analysis; lightning; lightning protection; FDTD simulation; finite difference time domain method; grounding resistance; horizontal grounding grid; lightning discharge current distribution; shielding effect; vertical grounding rod; Current distribution; Electromagnetic compatibility; Finite difference methods; Grounding; Lightning; Meteorology; Numerical analysis; Programmable logic arrays; Time domain analysis; Transient response; finite-difference time-domain (FDTD) method; grounding grid; lightning current discharge; numerical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475542
  • Filename
    5475542