Title :
Characterization of quarter wavelength line as measurement standard for scattering parameter in the frequency range of W-band and D-band
Author :
Horibe, Masahiro ; Kishikawa, Ryoko
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
Abstract :
This paper summarizes the technique to characterize quarter wavelength lines of rectangular waveguides as measurement standards for scattering parameters. The scattering parameters and their uncertainties were theoretically calculated using their dimensions. The SI traceability was established for the standard in the frequency range of W-band (from 75 GHz to 110 GHz) and D-band (from 110 GHz to 170 GHz).
Keywords :
electromagnetic wave scattering; D-band frequency range; SI traceability; W-band frequency range; measurement standard; measurement standards; quarter wavelength line; rectangular waveguides; scattering parameter; Apertures; Frequency measurement; Length measurement; Scattering parameters; Standards; Transmission line measurements; Uncertainty;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2012 37th International Conference on
Conference_Location :
Wollongong, NSW
Print_ISBN :
978-1-4673-1598-2
Electronic_ISBN :
2162-2027
DOI :
10.1109/IRMMW-THz.2012.6380303
