DocumentCode :
2511483
Title :
TEM Examination of Microstructures in LiNbO3Optical Waveguides
Author :
Lee, L.E. ; Sanford, N.A. ; Heuer, A.H.
fYear :
1986
fDate :
8-11 June 1986
Firstpage :
93
Lastpage :
96
Keywords :
Capacitive sensors; Ceramics; Crystal microstructure; Crystalline materials; Electron optics; Materials science and technology; Optical films; Optical materials; Optical waveguides; Thick films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics. 1986 Sixth IEEE International Symposium on
Conference_Location :
Bethlehem, PA, USA
Type :
conf
DOI :
10.1109/ISAF.1986.201103
Filename :
1538043
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2511483
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