DocumentCode :
2511733
Title :
The optical and structural properties of CuGaSe2 polycrystalline thin films
Author :
Albin, D. ; Tuttle, J. ; Goral, J. ; Mason, A. ; Noufi, R. ; Risbud, S.H.
Author_Institution :
Solar Energy Res. Inst., Golden, CO, USA
fYear :
1988
fDate :
1988
Firstpage :
1495
Abstract :
The optical properties of CuGaSe2 polycrystalline thin films deposited by multisource evaporation as a function of composition and substrate temperature are discussed in terms of the crystal structure and film morphology. Absorption coefficients were determined from total reflection and transmission measurements between 400 and 800 nm. Absorption humps in the absorption spectra are attributed to valence subband transitions, the magnitudes of which were related to the crystal structure of the films as determined by X-ray diffraction. Band splitting by crystal field and spin-orbit effects was observed at 1.741 and 1.932 eV in stoichiometric and Cu-rich films which contained mainly tetragonal chalcopyrite material. Cu-poor material, however, contained a predominance of the cubic sphalerite phase and exhibited the spin orbit effect alone at 1.992 eV. Also observed was a change in bandgap from 1.662 eV for stoichiometric to 1.718 eV for Cu-poor films.
Keywords :
X-ray diffraction examination of materials; copper compounds; crystal field interactions; energy gap; gallium compounds; optical constants; semiconductor thin films; spin-orbit interactions; ternary semiconductors; visible spectra of inorganic solids; 1.662 eV; 1.718 eV; 1.992 eV; 400 to 800 nm; CuGaSe2; X-ray diffraction; absorption coefficients; absorption spectra; band splitting; bandgap; composition; crystal field; crystal structure; cubic sphalerite phase; film morphology; multisource evaporation; optical properties; polycrystalline thin films; semiconductor; spin-orbit effects; structural properties; substrate temperature; tetragonal chalcopyrite material; total reflection; transmission measurements; valence subband transitions; Crystalline materials; Electromagnetic wave absorption; Extraterrestrial measurements; Morphology; Optical films; Optical reflection; Phase change materials; Sputtering; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location :
Las Vegas, NV, USA
Type :
conf
DOI :
10.1109/PVSC.1988.105959
Filename :
105959
Link To Document :
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