DocumentCode
2511744
Title
Integrating self testability with design space exploration by a controller based estimation technique
Author
Gaur, M.S. ; Zwolinski, M.
Author_Institution
Sch. of Electron. & Comput. Sci., Southampton Univ., UK
fYear
2004
fDate
2004
Firstpage
901
Lastpage
906
Abstract
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-Transfer-Level (RTL) data path generated from a behavioural description to make more testable. Although it can be argued that good results have been obtained-with such approaches, we must keep in mind that with the emergence of commercial behavioural synthesis tools it is difficult for the designer to understand an automatically generated structural RTL description. With the ever increasing complexity and pressure to shorten time to market, test synthesis must not be dissociated from design synthesis. This paper shows that it is possible to generate optimised self-testable RTL when addressed at the highest level of abstraction ie., behavioural description. This is achieved by developing a novel and accurate Built-in Self-Test (BIST) resource estimation technique based on exploitation of certain characteristics of the controller of the design.
Keywords
automatic testing; built-in self test; controllers; design for testability; integrated circuit design; BIST resource estimation; RTL data path; builtin self test; commercial behavioural synthesis tools; controller based estimation technique; design space exploration; register transfer level; self testability; test structure; test synthesis; time to market; Automatic testing; Built-in self-test; Computer science; Consumer electronics; Electronic equipment testing; Hardware design languages; Logic gates; Scheduling; Space exploration; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN
0-7695-2072-3
Type
conf
DOI
10.1109/ICVD.2004.1261045
Filename
1261045
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