An improved dual-probe approach to measure noise source impedance

Author

Bo, Zhao ; Min, Zhao ; Zhiming, Feng ; Limin, Shui ; Min, Yao

Author_Institution

Coll. of Autom. Eng., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China

fYear

2010

fDate

12-16 April 2010

Firstpage

214

Lastpage

217

Abstract

In this paper an improved dual-probe approach is proposed to measure the source impedance of conducted EMI noise. Two-impedance method, which can reduce the influence of testing cable loss caused by high frequency, instead of short-circuit method is used to minimize the measurement errors of conducted EMI noise source impedance. A switched-mode power supply (SMPS) is taken to measure its conducted EMI noise source impedance. Experimental results show that this method is feasible and can improve testing inaccuracy of conducted EMI noise source impedance.

Keywords

electromagnetic interference; switched mode power supplies; EMI noise source impedance; cable loss; dual-probe approach; measurement errors; short circuit method; switched-mode power supply; two-impedance method; Circuit noise; Electromagnetic interference; Electromagnetic measurements; Extraterrestrial measurements; Frequency; Impedance measurement; Loss measurement; Noise measurement; Probes; Testing; Dual-probe Approach; Electromagnetic Interference (EMI); Noise Source Impedance;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on

Conference_Location

Beijing

Print_ISBN

978-1-4244-5621-5

Type

conf

DOI

10.1109/APEMC.2010.5475573

Filename

5475573