Title :
Application of wavelets and generalized pencil-of-function method for the extraction of noise current spectrum and simulation of simultaneous switching noise
Author :
Mandrekar, Rohan ; Swaminathan, Madhavan ; Chun, Sungjun
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
In high performance systems, the voltage fluctuation noise caused by the simultaneous switching of circuits is an important concern in relation to signal integrity and radiated emission related issues. For proper design of the Power Distribution System the noise current is required as an input for the simulation of the simultaneous switching noise. This paper proposes a measurement based approach to estimate the noise current spectrum in a functioning computer system. Its also discusses a method for extracting the current signature needed to simulate switching noise in the system. The proposed approach is tested on a high speed functioning computer system from Sun Microsystems. Using the current source developed, simultaneous switching noise in the core power distribution network of the system has been simulated with good accuracy.
Keywords :
distribution networks; equivalent circuits; fluctuations; integrated circuit noise; singular value decomposition; Sun microsystems; computer system; generalized pencil of function; noise current spectrum extraction; power distribution network; power distribution system; radiated emission; signal integrity; simultaneous switching noise simulation; voltage fluctuation noise; wavelets; Circuit noise; Circuit simulation; Computational modeling; Current measurement; Noise measurement; Power distribution; Sun; Switching circuits; System testing; Voltage fluctuations;
Conference_Titel :
VLSI Design, 2004. Proceedings. 17th International Conference on
Print_ISBN :
0-7695-2072-3
DOI :
10.1109/ICVD.2004.1261060