DocumentCode
2512130
Title
Atmospheric turbulence effects on radar systems
Author
McMillan, R.W.
Author_Institution
US Army Space & Missile Defense Command, Huntsville, AL, USA
fYear
2010
fDate
14-16 July 2010
Firstpage
181
Lastpage
196
Abstract
Atmospheric turbulence has been shown to have measurable effects on several aspects of radar performance. In this paper we discuss the perturbation of the angle-of-arrival (AOA) of radar beams caused by the atmosphere, the effects of lognormal- and Weibull-distributed clutter on detection performance, and the detection probability of ultrawideband pulses propagated through the atmosphere in the presence of turbulence and Gaussian noise. We find that AOA effects are on the order of a few microradians, which is a negligible level for most applications, but that clutter and noise, when combined with turbulent fluctuations, give some surprising results when the ratio of signal to clutter and noise is calculated. The detection of ultrawideband pulses is analogous to the “needle in a haystack” problem. In this paper, we present theories describing each of these phenomena, together with calculated results. For AOA, we have made measurements for one-way propagation that agree well with this theory, but the other phenomena have yet to be measured.
Keywords
Gaussian noise; Weibull distribution; atmospheric turbulence; direction-of-arrival estimation; log normal distribution; radar clutter; radar detection; radar signal processing; Gaussian noise; Weibull-distributed clutter; angle-of-arrival estimation; atmospheric turbulence; detection probability; lognormal-distributed clutter; radar beam; radar system; ultrawideband pulse; Antenna measurements; Equations; Mathematical model; Pollution measurement; Radar; Receivers; Repeaters; AOA; angle-of-arrival; detection probability; diffraction limited; microwave beams; signal-to-clutter-and-noise; turbulent atmosphere; ultrawideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference (NAECON), Proceedings of the IEEE 2010 National
Conference_Location
Fairborn, OH
ISSN
0547-3578
Print_ISBN
978-1-4244-6576-7
Type
conf
DOI
10.1109/NAECON.2010.5712944
Filename
5712944
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