DocumentCode :
2512142
Title :
Rep-rate influence on electromagnetic effects
Author :
Palisek, Libor ; Suchy, Lubos
Author_Institution :
Div. VTUPV, VOP-026 Sternberk, s.p., Vyskov, Czech Republic
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
146
Lastpage :
149
Abstract :
Some results obtained during experimental measurements of susceptibility of electronics to HPM and UWB irradiation with repetition rate signals are presented in this paper. Repetition rate dependence is considered for temporary failures as well as for damage levels too. As equipments under test are chosen regular PC setups. Simple electronic circuit are added for some experiments for possibility to achieve more results related to damage levels. Suitable simplified circuit models for HPM and UWB repetition rate effectiveness for achieving of typical effects on electronics is used for simulations. For this purpose model based on electrothermal analogy is used within the software OrCAD 15.7 (PSpice model) environment. Results from measurements are compared with results from simulations. At the end of this presentation recommendation for effective HPM and UWB rep-rate necessary to achieve typical failures of tested equipments is carried out.
Keywords :
SPICE; circuit CAD; electromagnetic fields; radiation effects; HPM; OrCAD 15.7; PSpice model; UWB irradiation; electromagnetic effects; electronic circuit; electrothermal analogy; repetition rate dependence; repetition rate signals; Capacitance; Circuit simulation; Circuit testing; EMP radiation effects; Electric breakdown; Electromagnetic compatibility; Electromagnetic measurements; Frequency; Pulse circuits; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475592
Filename :
5475592
Link To Document :
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