DocumentCode
2512231
Title
Resistive and photoconductive effects in spectral response measurements
Author
Phillips, J.E. ; Roy, M.
Author_Institution
Inst. of Energy Conversion, Delaware Univ., Newark, DE, USA
fYear
1988
fDate
1988
Firstpage
1614
Abstract
It is shown that AC spectral response measurements done under DC bias voltage and bias illumination can include nonnegligible modulation effects from the series resistance of the device under test. The modulation effects change both the shape and the magnitude of the spectral response curve as a function of bias voltage and bias illumination. It is shown how high-efficiency CuInSe2/CdS devices exhibit this kind of behavior and how to correct for it. By analyzing the spectral response of CuInSe2/CdS devices as a function of voltage bias, a value of the series resistance is extracted which agrees with that derived from I-V measurements.
Keywords
II-VI semiconductors; cadmium compounds; copper compounds; photoconductivity; semiconductor junctions; ternary semiconductors; CuInSe2-CdS devices; modulation; photoconductive effects; resistive effects; semiconductor; series resistance; spectral response; Character generation; Difference equations; Diodes; Electrical resistance measurement; Energy measurement; Lighting; Photoconductivity; Shape; Short circuit currents; Spectral analysis; Testing; Thermal resistance; Voltage; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location
Las Vegas, NV, USA
Type
conf
DOI
10.1109/PVSC.1988.105985
Filename
105985
Link To Document