• DocumentCode
    2512231
  • Title

    Resistive and photoconductive effects in spectral response measurements

  • Author

    Phillips, J.E. ; Roy, M.

  • Author_Institution
    Inst. of Energy Conversion, Delaware Univ., Newark, DE, USA
  • fYear
    1988
  • fDate
    1988
  • Firstpage
    1614
  • Abstract
    It is shown that AC spectral response measurements done under DC bias voltage and bias illumination can include nonnegligible modulation effects from the series resistance of the device under test. The modulation effects change both the shape and the magnitude of the spectral response curve as a function of bias voltage and bias illumination. It is shown how high-efficiency CuInSe2/CdS devices exhibit this kind of behavior and how to correct for it. By analyzing the spectral response of CuInSe2/CdS devices as a function of voltage bias, a value of the series resistance is extracted which agrees with that derived from I-V measurements.
  • Keywords
    II-VI semiconductors; cadmium compounds; copper compounds; photoconductivity; semiconductor junctions; ternary semiconductors; CuInSe2-CdS devices; modulation; photoconductive effects; resistive effects; semiconductor; series resistance; spectral response; Character generation; Difference equations; Diodes; Electrical resistance measurement; Energy measurement; Lighting; Photoconductivity; Shape; Short circuit currents; Spectral analysis; Testing; Thermal resistance; Voltage; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
  • Conference_Location
    Las Vegas, NV, USA
  • Type

    conf

  • DOI
    10.1109/PVSC.1988.105985
  • Filename
    105985