• DocumentCode
    2512268
  • Title

    Virtual ESD testing of automotive electronic systems

  • Author

    Arndt, Bastian ; Nieden, Friedrich Zur ; Mueller, Felix ; Edenhofer, Johannes ; Frei, Stephan

  • Author_Institution
    Continental Automotive GmbH, Regensburg, Germany
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    683
  • Lastpage
    686
  • Abstract
    ESD events can cause numerous destruction effects in automotive electronic circuits. A prediction of ESD stress on system level is difficult and numerous iteration loops in the development process are necessary to fulfill the demands of automotive customers. A concept for system level ESD simulation is presented to predict robustness against ESD. Independent models of the different system components were developed and implemented, in order to build up a simulation process chain focused on ESD protection demands. The simulation method was characterized and compared with real measurements.
  • Keywords
    automotive electronics; electrical engineering computing; electrostatic discharge; testing; virtual reality; ESD stress prediction; automotive customers; automotive electronic systems; destruction effects; simulation process chain; system level ESD simulation; virtual ESD testing; Automotive electronics; Automotive engineering; Circuit simulation; Circuit testing; Electronic equipment testing; Electrostatic discharge; Predictive models; Robustness; Stress; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475598
  • Filename
    5475598