Title :
Virtual ESD testing of automotive electronic systems
Author :
Arndt, Bastian ; Nieden, Friedrich Zur ; Mueller, Felix ; Edenhofer, Johannes ; Frei, Stephan
Author_Institution :
Continental Automotive GmbH, Regensburg, Germany
Abstract :
ESD events can cause numerous destruction effects in automotive electronic circuits. A prediction of ESD stress on system level is difficult and numerous iteration loops in the development process are necessary to fulfill the demands of automotive customers. A concept for system level ESD simulation is presented to predict robustness against ESD. Independent models of the different system components were developed and implemented, in order to build up a simulation process chain focused on ESD protection demands. The simulation method was characterized and compared with real measurements.
Keywords :
automotive electronics; electrical engineering computing; electrostatic discharge; testing; virtual reality; ESD stress prediction; automotive customers; automotive electronic systems; destruction effects; simulation process chain; system level ESD simulation; virtual ESD testing; Automotive electronics; Automotive engineering; Circuit simulation; Circuit testing; Electronic equipment testing; Electrostatic discharge; Predictive models; Robustness; Stress; System testing;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475598