Title :
Confidence of waveguide VNA Measurement in the frequency range of W-band and D-band
Author :
Kishikawa, Ryoko ; Horibe, Masahiro
Author_Institution :
Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
Abstract :
In the frequency range of W-band and D-band, we report, in this paper, technique of evaluating typical errors which are essential factors for confidence of VNA measurements. They were estimated using the S-parameter standard developed at NMIJ. This process ensures the SI traceability in VNA measurements.
Keywords :
S-parameters; network analysers; D-band; NMIJ; S-parameter; SI traceability; W-band; vector network analyser; waveguide VNA measurement; Calibration; Frequency measurement; Measurement uncertainty; Scattering parameters; Standards; Uncertainty;
Conference_Titel :
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2012 37th International Conference on
Conference_Location :
Wollongong, NSW
Print_ISBN :
978-1-4673-1598-2
Electronic_ISBN :
2162-2027
DOI :
10.1109/IRMMW-THz.2012.6380360
