Effect of substrate temperature dependence on six-port reflectometer performance

Author

Julrat, Sakol ; Chongcheawchamnan, Mitchai ; Khaorapapong, Thanate

Author_Institution

Comput. Eng. Dept., Prince of Songkla Univ., Songkhla, Thailand

fYear

2010

fDate

12-16 April 2010

Firstpage

866

Lastpage

869

Abstract

This paper first investigates the effect of substrate temperature dependence on performances of six-port reflectometer (SPR) designed for measuring complexity permittivity. The temperature-dependent effect on the substrate is described by the variation of dielectric constant (έ_r) and dissipation factor (tanδ). Here, two printed circuit boards (RO3003^® and RO3010^®) with two different substrate materials are used for designing the SPRs operating at 4 GHz. The accuracy of these SPRs to predict moisture content in rubber latex over a certain temperature range will be studied. The obtained results indicate that the temperature dependent of the substrate has an impact on the SPR performances.

Keywords

moisture measurement; permittivity; permittivity measurement; printed circuits; reflectometers; rubber; substrates; SPR; complexity permittivity measurement; dielectric constant; dissipation factor; frequency 4 GHz; moisture content; printed circuit boards; rubber latex; six-port reflectometer performance; substrate materials; substrate temperature dependence; Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Moisture; Performance evaluation; Permittivity measurement; Printed circuits; Rubber; Temperature dependence; Six-port reflectometer; substrate material; temperature dependent;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on

Conference_Location

Beijing

Print_ISBN

978-1-4244-5621-5

Type

conf

DOI

10.1109/APEMC.2010.5475613

Filename

5475613