• DocumentCode
    2512589
  • Title

    Investigation of temperature dependent microwave performance of AlGaN/GaN MISHFETs for high power wireless applications

  • Author

    Aggarwal, Richie ; Agrawal, Ankit ; Gupta, Madhu ; Gupta, R.S.

  • Author_Institution
    Dept. of Electron. Sci., Univ. of Delhi, New Delhi
  • fYear
    2008
  • fDate
    21-24 Nov. 2008
  • Firstpage
    66
  • Lastpage
    68
  • Abstract
    The objective of this paper is to investigate and explore the potential of AlGaN/GaN based metal insulator semiconductor heterostructure field effect transistor (MISHFET) device for high temperature applications. A temperature dependent analytical model is proposed taking into account the effect of various temperature dependent material properties. The electrical characteristics like drain current, transconductance, cut-off frequency and saturation output power are evaluated for temperature range up to 573 K and a relative comparison is done with conventional HFET structures.
  • Keywords
    III-V semiconductors; MISFET; aluminium compounds; gallium compounds; high-temperature electronics; microwave field effect transistors; power HEMT; thermal analysis; wide band gap semiconductors; AlGaN-GaN; MISHFET; high power wireless applications; high temperature applications; metal insulator semiconductor heterostructure field effect transistor; temperature dependent microwave performance; Aluminum gallium nitride; Analytical models; Gallium nitride; HEMTs; Insulation; MODFETs; Material properties; Metal-insulator structures; Microwave devices; Temperature dependence; AlGaN/GaN MISHFET; cut-off frequency; saturation drain current; saturation output power; threshold voltage; wide band gap semiconductor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
  • Conference_Location
    Jaipur
  • Print_ISBN
    978-1-4244-2690-4
  • Electronic_ISBN
    978-1-4244-2691-1
  • Type

    conf

  • DOI
    10.1109/AMTA.2008.4763139
  • Filename
    4763139