DocumentCode
2512614
Title
Fast Derivation of Soil Surface Roughness Parameters Using Multi-band SAR Imagery and the Integral Equation Model
Author
Seppke, Benjamin ; Dreschler-Fischer, Leonie ; Heiming, Jo-Ann ; Wengenroth, Felix
Author_Institution
Dept. of Inf., Univ. of Hamburg, Hamburg, Germany
fYear
2010
fDate
23-26 Aug. 2010
Firstpage
3931
Lastpage
3934
Abstract
The Integral Equation Model (IEM) predicts the normalized radar cross section (NRCS) of dielectric surfaces given surface and radar parameters. To derive the surface parameters from the NRCS using the IEM, the model needs to be inverted. We present a fast method of this model inversion to derive soil surface roughness parameters from synthetic aperture radar (SAR) remote sensing data. The model inversion is based on two different collocated SAR images of different bands, the derivation of the parameters cannot be done using one band alone. The computation of the model and the model inversion are very time consuming tasks and therefore may be impractical for large remote sensing data. We present an approach that is based on a few model assumptions to speed up the computation of the surface parameters. We applied the algorithm to detect the correlation length of the surface for dry-fallen areas in the World Cultural Heritage ”Wadden Sea”, a coastal tidal flat at the German Bight (North Sea). The results are very promising and may be used for a classification of the area in future steps.
Keywords
geophysical image processing; geophysical techniques; integral equations; radar cross-sections; radar imaging; remote sensing; soil; synthetic aperture radar; SAR remote sensing data; Wadden Sea; World Cultural Heritage; correlation length; dielectric surfaces; dry-fallen areas; integral equation model; model inversion; multiband SAR imagery; normalized radar cross section; soil surface roughness parameters; synthetic aperture radar; Computational modeling; Correlation; Radar imaging; Rough surfaces; Sea surface; Surface roughness; Classification; Performance evaluation; Physics-based modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location
Istanbul
ISSN
1051-4651
Print_ISBN
978-1-4244-7542-1
Type
conf
DOI
10.1109/ICPR.2010.956
Filename
5597671
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