DocumentCode :
2512614
Title :
Fast Derivation of Soil Surface Roughness Parameters Using Multi-band SAR Imagery and the Integral Equation Model
Author :
Seppke, Benjamin ; Dreschler-Fischer, Leonie ; Heiming, Jo-Ann ; Wengenroth, Felix
Author_Institution :
Dept. of Inf., Univ. of Hamburg, Hamburg, Germany
fYear :
2010
fDate :
23-26 Aug. 2010
Firstpage :
3931
Lastpage :
3934
Abstract :
The Integral Equation Model (IEM) predicts the normalized radar cross section (NRCS) of dielectric surfaces given surface and radar parameters. To derive the surface parameters from the NRCS using the IEM, the model needs to be inverted. We present a fast method of this model inversion to derive soil surface roughness parameters from synthetic aperture radar (SAR) remote sensing data. The model inversion is based on two different collocated SAR images of different bands, the derivation of the parameters cannot be done using one band alone. The computation of the model and the model inversion are very time consuming tasks and therefore may be impractical for large remote sensing data. We present an approach that is based on a few model assumptions to speed up the computation of the surface parameters. We applied the algorithm to detect the correlation length of the surface for dry-fallen areas in the World Cultural Heritage ”Wadden Sea”, a coastal tidal flat at the German Bight (North Sea). The results are very promising and may be used for a classification of the area in future steps.
Keywords :
geophysical image processing; geophysical techniques; integral equations; radar cross-sections; radar imaging; remote sensing; soil; synthetic aperture radar; SAR remote sensing data; Wadden Sea; World Cultural Heritage; correlation length; dielectric surfaces; dry-fallen areas; integral equation model; model inversion; multiband SAR imagery; normalized radar cross section; soil surface roughness parameters; synthetic aperture radar; Computational modeling; Correlation; Radar imaging; Rough surfaces; Sea surface; Surface roughness; Classification; Performance evaluation; Physics-based modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
ISSN :
1051-4651
Print_ISBN :
978-1-4244-7542-1
Type :
conf
DOI :
10.1109/ICPR.2010.956
Filename :
5597671
Link To Document :
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