DocumentCode
2512631
Title
Fluxless and substantially voidless soldering for semiconductor chips
Author
Mizuishi, Ken´ichi ; Tokuda, Masahide ; Fujita, Yuuji
Author_Institution
Hitachi Ltd., Tokyo, Japan
fYear
1988
fDate
9-11 May 1988
Firstpage
330
Lastpage
334
Abstract
A soldering method for reliability fabricating a composite structure is presented. This method, which need not use flux, provides a substantially voidless layer of solder that has low thermal resistance and excellent mechanical strength. A detailed description of soldering procedure, which uses a square, washer-shaped solder preform, is given. The experimental results show that the voids in the solder layer were reduced to less than 5% in bonds of silicon chips with a size of 1 cm 2. When 3-in silicon wafer chips were used, a similar void reduction took place. Moreover, pure solder flowed into the vacant region within the preform in such a manner that the native oxide film at the surface of the preform was removed. This resulted in an average solder bond shear strength that was greater than that obtained in the conventional manner using flux. The method was successfully applied to the fabrication of a multichip module. It was also used to make a high-voltage diode composed of ten silicon chips piled up vertically and connected with solder
Keywords
hybrid integrated circuits; packaging; semiconductor diodes; soldering; 1 cm; 3 in; Si chips; chips piled up vertically; experimental results; fabrication; fluxless soldering; high-voltage diode; low thermal resistance; mechanical strength; multichip module; semiconductor chip soldering; solder bond shear strength; soldering method; soldering procedure; void reduction; voidless soldering; washer-shaped solder preform; Atmosphere; Heat sinks; Multichip modules; Preforms; Semiconductor device reliability; Silicon; Soldering; Temperature; Thermal resistance; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Components Conference, 1988., Proceedings of the 38th
Conference_Location
Los Angeles, CA
Type
conf
DOI
10.1109/ECC.1988.12613
Filename
12613
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