Title :
Why hardware developers should support continued development of RF/microwave exposure standards
Author :
Ziriax, John M. ; D´Andrea, John A.
Author_Institution :
Directed Energy Bioeffects Dept., Naval Med. Res. Unit/San Antonio, Brooks City-Base, TX, USA
Abstract :
Hardware developers often seem to view compliance with exposure standards as a necessary evil to be put off for fear a non-compliant outcome could end a project, or because it is assumed that the device poses no health risk. The public, on the other hand, continues to see health risks in even the lowest power devices, such as cell phones; while simultaneously adopting new technologies. If developers are to maximize the potential benefits of RF/MW technology, they must understand what drives the development of exposures standards, their acceptance by the public, and how they might play a role in improving the standards and their public acceptance.
Keywords :
biological effects of microwaves; domestic safety; health and safety; microwave technology; standards; hardware developers; health risk; low power devices; microwave exposure standards; radiofrequency exposure standards; Cellular phones; Costs; Electromagnetic compatibility; Hardware; Humans; Injuries; Protection; Radio frequency; Roads; Standards development;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475642