Title :
Thermal Fluctuation Aftereffect of Exchange Coupled Films for Spin Valve Devices
Author :
Fujikata, J. ; Hayashi, K. ; Yamamoto, Hiroshi ; Nakada, Mayumi
Author_Institution :
NEC Corp., Japan
Keywords :
Annealing; Antiferromagnetic materials; Buffer layers; Fluctuations; Grain size; Helium; Magnetic field measurement; Spin valves; Temperature; Thermal stability;
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
DOI :
10.1109/INTMAG.1998.742500
