DocumentCode :
2513134
Title :
A new methodology to measure electromagnetic interferences in 3G mobile platform
Author :
Baffreau, Stéphane ; Akue-Boulingui, Samuel ; Dupoux, Céline ; Sicard, Etienne ; Bouvier, Nicolas ; Vrignon, Bertrand ; Boyer, Alexandre
Author_Institution :
IUT Tarbes-Lattis, Univ. of Toulouse 1, Toulouse, France
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
1076
Lastpage :
1079
Abstract :
This paper presents a new methodology to measure electromagnetic interferences in 3G mobile platform. The main objectives of this approach are to evaluate the near field coupling between two integrated circuits, and validate, in a predictive way, that the two devices can be mounted in a same package. The methodology consists in emulating the near field electromagnetic behavior of a disruptive chip. The emulation of the aggressor device is performed by means of a specific probe. Then a risk of interference analysis is performed to validate the EMC compliance between the two chips. This analysis provides valuable information about sensitive areas, coupling orientation and critical coupling distances by means of extraction. Details of this methodology are illustrated through a 3G mobile platform. Using this approach, chip-to-chip interferences can be investigated without requiring any specific EMC test board and with a low cost near field emulator.
Keywords :
3G mobile communication; integrated circuits; radiofrequency interference; 3G mobile platform; EMC compliance; chip-to-chip interferences; electromagnetic interference measurement; interference analysis; near field coupling; near field electromagnetic behavior; Coupling circuits; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Emulation; Integrated circuit measurements; Integrated circuit packaging; Probes; Risk analysis; 3G platform; EMC; chip to chip coupling; mobile phone; near-field; system-in-package;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475647
Filename :
5475647
Link To Document :
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