Title :
Characterization of an EMC test-chip
Author :
Van Wershoven, Loes
Author_Institution :
Philips Semicond. Syst. Lab., Eindhoven, Netherlands
Abstract :
A test-chip is developed with the aim to evaluate on-chip measures to ultimately improve the EMC behavior of ICs in their final applications. This paper describes the process of definition to obtain maximum benefit of the parameters chosen with the test-chip and some simulation results of the measures taken. With an example on output drivers the analyzing method is verified. Simulations showed that the use of slew-rate controlled output drivers show large improvement over the non-slew-rate controlled output drivers
Keywords :
circuit simulation; driver circuits; electromagnetic compatibility; integrated circuit measurement; integrated circuit testing; EMC behavior; EMC test-chip; Taguchi method; non-slew-rate controlled output drivers; on-chip decoupling; on-chip measures; simulation results; slew-rate controlled output drivers; test-chip measurement; test-chip results; Clocks; Current measurement; Current supplies; Electromagnetic compatibility; Hardware; Integrated circuit testing; Laboratories; Semiconductor device measurement; Time measurement; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
DOI :
10.1109/ISEMC.2000.875548
