Title :
A lag-free 1024*1024 progressive scan interline CCD image sensor with antiblooming and exposure control
Author :
Stevens, E.G. ; Burkey, B.C. ; Nichols, D.N. ; Yee, Y. ; Losee, D.L. ; Lee, T.H. ; Tredwell, T.J. ; Khosla, R.P.
Author_Institution :
Eastman Kodak Co., Rochester, NY, USA
Abstract :
A 1024*1024 IL CCD (charge coupled device) image sensor has been developed that incorporates antiblooming and electronic exposure control while eliminating lag and obtaining a high responsivity. The incorporation of the antiblooming structure and electronic exposure control has been achieved without sacrificing other important device characteristics such as lag, smear, photoresponse linearity, and sensitivity. The progressive-scan architecture of this device offers the same resolution in an electronic-camera application as that of a two-million element, interlaced device. A noninterlaced scan with dual-horizontal registers makes it well suited for high-speed, machine vision applications.<>
Keywords :
CCD image sensors; picture processing; 1024 pixels; 1048576 pixels; antiblooming structure; dual-horizontal registers; electronic exposure control; electronic-camera application; high responsivity; high speed machine vision applications; lag; lag-free sensors; noninterlaced scan; photoresponse linearity; progressive scan interline CCD image sensor; resolution; sensitivity; smear; Cameras; Charge-coupled image sensors; Noise reduction; Photodiodes; Pixel; Robot sensing systems; Robot vision systems; Semiconductor device measurement; Service robots; Voltage;
Conference_Titel :
Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-0817-4
DOI :
10.1109/IEDM.1989.74253