Title :
Modelling approaches for nanotechnology applied to electromagnetic compatibility
Author :
Sarto, M.S. ; Tamburrano, A.
Author_Institution :
Dept. of Electr. Eng., Sapienza Univ. of Rome, Rome, Italy
Abstract :
The current approach to multi-scale modelling and simulation of advanced materials for EMC applications are discussed and presented. The critical issues related to the integration of modelling methods at different scales are addressed. Examples are given that illustrate the suggested approaches to predict the behavior and to influence the design of nanostructured materials for next generation nano-interconnects and frequency selective surfaces.
Keywords :
electromagnetic compatibility; nanostructured materials; nanotechnology; advanced materials; electromagnetic compatibility; frequency selective surfaces; multiscale modelling; nanostructured materials; nanotechnology; next generation nano-interconnects; Carbon nanotubes; Computational modeling; Electromagnetic compatibility; Electromagnetic modeling; Frequency selective surfaces; Lattices; Nanomaterials; Nanostructured materials; Nanotechnology; Predictive models; Electromagnetic modelling; nanointerconnects; nanomaterials; nanotechnology;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475668
