DocumentCode :
2513619
Title :
Investigation of the shielding on the mobile phone PCB using FDTD
Author :
Li, Chung-Huan ; Futter, Peter ; Chavannes, Nicolas ; Kuster, Niels
Author_Institution :
IT´´IS Found., ETH Zurich, Zurich, Switzerland
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
657
Lastpage :
659
Abstract :
The coupling mechanisms between the active traces and a victim trace with two victim ports on a real phone PCB model was investigated with FDTD simulation in this paper. The studied scenarios include the PCB with a full shielding, perforated shielding and no shielding. Firstly, the coupling performance of the real phone PCB was reproduced with numerical simulations. According to the simulation results, a simplified PCB model was developed based on the real phone PCB to study the coupling mechanisms with no shielding and different geometries of the shielding, including the dimensions and perforated shielding. The understanding from the investigation were applied to interpret the performance in the real phone PCB.
Keywords :
coupled circuits; electromagnetic shielding; finite difference time-domain analysis; mobile handsets; numerical analysis; printed circuit design; FDTD simulation; active trace; coupling mechanism; coupling performance; full shielding; mobile phone; no shielding; numerical simulation; perforated shielding; real phone PCB model; victim port; victim trace; Circuit simulation; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic modeling; Finite difference methods; Mobile handsets; Numerical simulation; Solid modeling; Time domain analysis; Traffic control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475672
Filename :
5475672
Link To Document :
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