DocumentCode
2513619
Title
Investigation of the shielding on the mobile phone PCB using FDTD
Author
Li, Chung-Huan ; Futter, Peter ; Chavannes, Nicolas ; Kuster, Niels
Author_Institution
IT´´IS Found., ETH Zurich, Zurich, Switzerland
fYear
2010
fDate
12-16 April 2010
Firstpage
657
Lastpage
659
Abstract
The coupling mechanisms between the active traces and a victim trace with two victim ports on a real phone PCB model was investigated with FDTD simulation in this paper. The studied scenarios include the PCB with a full shielding, perforated shielding and no shielding. Firstly, the coupling performance of the real phone PCB was reproduced with numerical simulations. According to the simulation results, a simplified PCB model was developed based on the real phone PCB to study the coupling mechanisms with no shielding and different geometries of the shielding, including the dimensions and perforated shielding. The understanding from the investigation were applied to interpret the performance in the real phone PCB.
Keywords
coupled circuits; electromagnetic shielding; finite difference time-domain analysis; mobile handsets; numerical analysis; printed circuit design; FDTD simulation; active trace; coupling mechanism; coupling performance; full shielding; mobile phone; no shielding; numerical simulation; perforated shielding; real phone PCB model; victim port; victim trace; Circuit simulation; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic modeling; Finite difference methods; Mobile handsets; Numerical simulation; Solid modeling; Time domain analysis; Traffic control;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5621-5
Type
conf
DOI
10.1109/APEMC.2010.5475672
Filename
5475672
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