• DocumentCode
    2513619
  • Title

    Investigation of the shielding on the mobile phone PCB using FDTD

  • Author

    Li, Chung-Huan ; Futter, Peter ; Chavannes, Nicolas ; Kuster, Niels

  • Author_Institution
    IT´´IS Found., ETH Zurich, Zurich, Switzerland
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    657
  • Lastpage
    659
  • Abstract
    The coupling mechanisms between the active traces and a victim trace with two victim ports on a real phone PCB model was investigated with FDTD simulation in this paper. The studied scenarios include the PCB with a full shielding, perforated shielding and no shielding. Firstly, the coupling performance of the real phone PCB was reproduced with numerical simulations. According to the simulation results, a simplified PCB model was developed based on the real phone PCB to study the coupling mechanisms with no shielding and different geometries of the shielding, including the dimensions and perforated shielding. The understanding from the investigation were applied to interpret the performance in the real phone PCB.
  • Keywords
    coupled circuits; electromagnetic shielding; finite difference time-domain analysis; mobile handsets; numerical analysis; printed circuit design; FDTD simulation; active trace; coupling mechanism; coupling performance; full shielding; mobile phone; no shielding; numerical simulation; perforated shielding; real phone PCB model; victim port; victim trace; Circuit simulation; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic modeling; Finite difference methods; Mobile handsets; Numerical simulation; Solid modeling; Time domain analysis; Traffic control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475672
  • Filename
    5475672