Title :
New low noise output amplifier for high definition CCD image sensor
Author :
Mutoh, N. ; Morimoto, M. ; Nishimura, M. ; Teranishi, N. ; Oda, E.
Author_Institution :
NEC Corp., Kanagawa, Japan
Abstract :
A novel low-noise CCD (charge coupled device) output amplifier, the RJG detector, has been developed. The RJG detector incorporates a JFET having an electrically floating ring-junction gate (RJG). The operating principle is that signal charges, transferred from CCD into the RJG, directly modulate the drain current in the detection JFET. Test devices were fabricated and evaluated with 37-MHz clock frequency. By introducing JFET and achieving complete charge transfer in reset operation, 1/f noise has been reduced and reset noise has been completely eliminated. As a result, input referred noise equivalent electrons within the 18.5 MHz baseband were reduced to 17 (electrons). The RJG detector is confirmed to be suitable for a high-definition CCD image sensor, which requires high-speed operation.<>
Keywords :
CCD image sensors; amplifiers; field effect integrated circuits; interference suppression; linear integrated circuits; 1/f noise; 180.5 MHz; 37 MHz; JFET; RJG detector; charge transfer; clock frequency; drain current; electrically floating ring-junction gate; high definition CCD image sensor; high-speed operation; input referred noise equivalent electrons; low noise output amplifier; reset noise; reset operation; signal charges; Charge coupled devices; Charge transfer; Charge-coupled image sensors; Clocks; Detectors; Electrons; Frequency; Low-noise amplifiers; Noise reduction; Testing;
Conference_Titel :
Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-0817-4
DOI :
10.1109/IEDM.1989.74254
