• DocumentCode
    2513787
  • Title

    FDTD modeling of absorbing materials for EMI applications

  • Author

    Xu, Jianfeng ; Koledintseva, Marina Y. ; De, Soumya ; Radchenko, Andriy ; Dubroff, Richard E. ; Drewniak, James L. ; He, Yongxue ; Johnson, Richard

  • Author_Institution
    Center for EMC, Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    173
  • Lastpage
    176
  • Abstract
    A few scenarios of applying different magneto-dielectric absorbing sheet materials to mitigate electromagnetic inference (EMI) are analyzed in this paper using a full-wave 3D finite-difference time-domain (FDTD) technique. Frequency characteristics of both permittivity and permeability of these magneto-dielectric materials are approximated by the series of the Debye terms suitable for time-domain simulations. This approximation is accomplished using a new curve fitting technique based on the Legendre polynomials and the regression analysis optimization. The results of the numerical simulations are verified by the corresponding experiments, and the good agreement is obtained.
  • Keywords
    Legendre polynomials; absorbing media; curve fitting; dielectric materials; electromagnetic interference; finite difference time-domain analysis; magnetic permeability; permittivity; regression analysis; 3D finite difference time-domain technique; EMI; FDTD modeling; Legendre polynomials; curve fitting technique; electromagnetic interference; magnetodielectric absorbing sheet materials; permeability; permittivity; regression analysis optimization; Electromagnetic analysis; Electromagnetic interference; Finite difference methods; Frequency; Magnetic analysis; Magnetic materials; Permeability; Permittivity; Sheet materials; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475680
  • Filename
    5475680