DocumentCode :
2513798
Title :
A Measure of Competence Based on Randomized Reference Classifier for Dynamic Ensemble Selection
Author :
Woloszynski, Tomasz ; Kurzynski, Marek
Author_Institution :
Dept. of Comput. Syst. & Networks, Wroclaw Univ. of Technol., Wroclaw, Poland
fYear :
2010
fDate :
23-26 Aug. 2010
Firstpage :
4194
Lastpage :
4197
Abstract :
This paper presents a measure of competence based on a randomized reference classifier (RRC) for classifier ensembles. The RRC can be used to model, in terms of class supports, any classifier in the ensemble. The competence of a modelled classifier is calculated as the probability of correct classification of the respective RRC. A multiple classifier system (MCS) was developed and its performance was compared against five MCSs using eight databases taken from the UCI Machine Learning Repository. The system developed achieved the highest overall classification accuracies for both homogeneous and heterogeneous ensembles.
Keywords :
learning (artificial intelligence); pattern classification; UCI machine learning repository; competence measure; dynamic ensemble selection; heterogeneous ensembles; homogeneous ensembles; multiple classifier system; randomized reference classifier; Accuracy; Artificial neural networks; Databases; Mathematical model; Pattern recognition; Probabilistic logic; Training; competence measure; multiple classifier system; probabilistic modelling; randomized classification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
ISSN :
1051-4651
Print_ISBN :
978-1-4244-7542-1
Type :
conf
DOI :
10.1109/ICPR.2010.1019
Filename :
5597745
Link To Document :
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