DocumentCode :
2513845
Title :
Using digital data processing to speed up radar phase noise measurements
Author :
Guhse, David ; Luster, Brian ; Prcic, Mike
Author_Institution :
Hughes Aircraft Co., El Segundo, CA, USA
fYear :
1994
fDate :
20-22 Sep 1994
Firstpage :
205
Lastpage :
210
Abstract :
Amplitude modulated noise and phase noise measurements for airborne radars have traditionally been performed by converting high frequency spectrums to the video range and measuring the analog noise and spurious parameters on conventional spectrum analyzers. The disadvantage of using spectrum analyzers is that test execution time is relatively long due to the slow sweep times required for selection of narrow resolution bandwidths. Also, since sweep times are long with spectrum analyzers, transient noise and other short time interval phenomena are difficult to detect (since they are usually “averaged out” due to the slow sweep). This has prompted the development of digital signal processing techniques to speed up the execution time and increase the accuracy of measurements. This paper describes an automated and efficient system that measures AM and PM response digitally. A digitizer is used to convert the analog signal to digital, whereupon a computer is used to process the digital data for noise and spurious response. This system allows for flexibility, since the processing may be altered by merely changing the computer software
Keywords :
airborne radar; automatic test equipment; automatic testing; electric noise measurement; electronic equipment testing; phase noise; quantisation (signal); radar signal processing; signal processing equipment; ATE; FFT; accuracy; airborne radars; amplitude modulated noise; computer software; digital data processing; digital signal processing; flexibility; radar phase noise measurement; spurious response; time; Amplitude modulation; Data processing; Frequency measurement; Noise level; Noise measurement; Phase measurement; Phase modulation; Phase noise; Radar; Spectral analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
Type :
conf
DOI :
10.1109/AUTEST.1994.381509
Filename :
381509
Link To Document :
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