RF/microwave test simulator

The generation of quality RF/Microwave Test Program Sets (TPS) has always been a technically challenging and expensive task. The lack of an RF/microwave test simulator makes the generation of test and diagnostic vectors a very time consuming task. RF/microwave components exhibit multiple fault modes, i.e. gain, noise figure, etc..., as compared to the “1” or “0” fault mode of digital circuitry. Also, due to the parametric nature of an RF/microwave device, each failure mode is application specific and forces the development of multiple fault classes. The result has increased TPS costs and stretched schedules when compared to digital testing where test simulators do exist. This paper outlines an approach to developing an RF/microwave Test Simulator. Design simulation software is utilized to provide a behavioral model of the Unit Under Test (UUT). A multi-dimensional fault dictionary is generated based on this behavioral knowledge which enables the tester to consider the multiple fault modes and fault classes in order to achieve “probeless” diagnostics