• DocumentCode
    2513966
  • Title

    A universal model of surface plasmon resonance characteristics for isotropic multilayer films

  • Author

    Luo Xue-feng ; Han Li

  • Author_Institution
    Inst. of Electr. Eng., Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    28-30 Nov. 2010
  • Firstpage
    263
  • Lastpage
    266
  • Abstract
    A theoretical model is presented for multilayered surface plasmon resonance sensors composed of isotropic materials. In the framework of optical transmission theory in multilayers, by solving Helmholtz equations, the expression of electromagnetic field distribution inside multilayered structures is established. This model is applied in the simulation of surface plasmon resonance characteristics of single Au layer, bilayer Co/Au and trilayer Au/Co/Au respectively. The calculated reflectivity curves are in excellent agreement with the experimental results. The simulated field distribution inside layered structures give an explicit explanation to the variations of reflectivity as a function of incident angle. Thus, the presented model can be used as an analytical tool in the format of SPR sensors.
  • Keywords
    Helmholtz equations; cobalt; gold; light transmission; metallic thin films; optical multilayers; optical sensors; reflectivity; surface plasmon resonance; Co-Au; Helmholtz equations; SPR sensor; cobalt-gold bilayer; electromagnetic field distribution; gold-cobalt-gold trilayer; isotropic multilayer films; multilayered surface plasmon resonance sensor; optical transmission theory; reflectivity curve; surface plasmon resonance simulation; universal model; Films; Gold; Mathematical model; Nonhomogeneous media; Optical surface waves; Plasmons; Reflectivity; Surface plasmon resonance (SPR); electromagnetic model; multilayer structures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Computing and Telecommunications (YC-ICT), 2010 IEEE Youth Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-8883-4
  • Type

    conf

  • DOI
    10.1109/YCICT.2010.5713095
  • Filename
    5713095