DocumentCode
2514112
Title
Rigorous modeling of the frequency dependence of ohmic losses in high-speed electrical interconnections
Author
Coperich, Karen M. ; Cangellaris, Andreas C. ; Ruehli, Albert E.
Author_Institution
Illinois Univ., Urbana, IL, USA
Volume
1
fYear
2000
fDate
2000
Firstpage
301
Abstract
A systematic methodology is presented for the development of SPICE-compatible models for printed circuit board interconnections exhibiting dispersion due to ohmic loss and skin effect. The important attributes of this methodology are: (a) a rigorous and computationally efficient approach for the extraction of the per-unit-length, frequency-dependent resistance and inductance matrices for a system of coupled interconnects. (b) The systematic development of an equivalent circuit for the discrete approximation of the generalized transmission line equations, that can be readily incorporated in standard SPICE-like circuit simulators
Keywords
SPICE; circuit simulation; equivalent circuits; impedance matrix; interconnections; losses; printed circuits; skin effect; transmission line theory; SPICE-compatible models; SPICE-like circuit simulators; coupled interconnects; discrete approximation; dispersion; equivalent circuit; frequency dependence; frequency-dependent resistance; generalized transmission line equations; high-speed electrical interconnections; inductance matrices; ohmic losses; printed circuit board interconnections; skin effect; Coupling circuits; Dispersion; Distributed parameter circuits; Equivalent circuits; Frequency dependence; Inductance; Integrated circuit interconnections; Printed circuits; Skin effect; Transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-5677-2
Type
conf
DOI
10.1109/ISEMC.2000.875582
Filename
875582
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