• DocumentCode
    2514125
  • Title

    Mining Static Code Metrics for a Robust Prediction of Software Defect-Proneness

  • Author

    Li, Lianfa ; Leung, Hareton

  • Author_Institution
    LREIS, Inst. of Geogr. Sci. & Natural Resources Res., Beijing, China
  • fYear
    2011
  • fDate
    22-23 Sept. 2011
  • Firstpage
    207
  • Lastpage
    214
  • Abstract
    Defect-proneness prediction is affected by multiple aspects including sampling bias, non-metric factors, uncertainty of models etc. These aspects often contribute to prediction uncertainty and result in variance of prediction. This paper proposes two methods of data mining static code metrics to enhance defect-proneness prediction. Given little non-metric or qualitative information extracted from software codes, we first suggest to use a robust unsupervised learning method, shared nearest neighbors (SNN) to extract the similarity patterns of the code metrics. These patterns indicate similar characteristics of the components of the same cluster that may result in introduction of similar defects. Using the similarity patterns with code metrics as predictors, defect-proneness prediction may be improved. The second method uses the Occam´s windows and Bayesian model averaging to deal with model uncertainty: first, the datasets are used to train and cross-validate multiple learners and then highly qualified models are selected and integrated into a robust prediction. From a study based on 12 datasets from NASA, we conclude that our proposed solutions can contribute to a better defect-proneness prediction.
  • Keywords
    Bayes methods; data mining; software metrics; unsupervised learning; Bayesian model; Occam windows; SNN; data mining; mining static code metrics; nonmetric information; qualitative information; robust prediction; shared nearest neighbors; software codes; software defect proneness; unsupervised learning method; Clustering algorithms; Data mining; Measurement; Predictive models; Robustness; Uncertainty; Unsupervised learning; data mining; defect-proneness; robust prediction; software quality; uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Empirical Software Engineering and Measurement (ESEM), 2011 International Symposium on
  • Conference_Location
    Banff, AB
  • ISSN
    1938-6451
  • Print_ISBN
    978-1-4577-2203-5
  • Type

    conf

  • DOI
    10.1109/ESEM.2011.29
  • Filename
    6092569