An update to applications of open standards to test automation to board-level testing

Author

Horth, Willis ; Nagy, James M. ; Debany, Warren H. ; Pritchett, Hugh ; Unkle, C.R. ; Swavely, William G. ; Newberg, Jeffery

Author_Institution

Rome Lab., Griffiss AFB, NY, USA

fYear

1994

fDate

20-22 Sep 1994

Firstpage

43

Lastpage

48

Abstract

An application of open standard formats to board-level test was described in a paper presented at AUTOTESTCON 1993. This paper provides an update to this work, including descriptions of the problems encountered and solutions developed in applying such standards to two specific printed circuit boards and two automatic test systems (ATSs): the GenRad 2751 and a Modular Automatic Test Equipment (MATE) compatible system. A complete test automation flow process developed around these open standards and data formats is described, including the specific software tools developed, and the input and output requirements of each tool

Keywords

automatic test equipment; automatic test software; printed circuit testing; standards; GenRad 2751; MATE; Modular Automatic Test Equipment; TISSS; Test Description Language; board-level testing; open standards; printed circuit boards; test automation; test automation flow; tester independent software support system; Automatic test equipment; Automatic testing; Automation; Circuit testing; Printed circuits; Software standards; Software testing; Software tools; Standards development; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.

Conference_Location

Anaheim, CA

Print_ISBN

0-7803-1910-9

Type

conf

DOI

10.1109/AUTEST.1994.381533

Filename

381533