• DocumentCode
    2514273
  • Title

    Return stroke current during Shandong artificially triggered lightning from 2005–2009

  • Author

    Qie, Xiushu ; Yang, Jing ; Jiang, Rubin ; Zhao, Yang ; Zhang, Guangshu ; Feng, Guili ; Zhang, Qilin ; Liu, Dongxia

  • Author_Institution
    Inst. of Atmos. Phys., Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    1285
  • Lastpage
    1288
  • Abstract
    Shandong artificial triggering lightning experiment (SHATLE) by means of rocket-wire technique, aimed to understand the close electromagnetic environment of lightning channel and its correlation to the discharge current, was started at 2005 in Binzhou, Shandong. Artificially triggered lightning is thought to be similar to the subsequent return strokes in natural lightning. Sixty seven negative return strokes were successfully triggered from 2005 to 2009. The discharge current at the base of the discharge channel and electromagnetic fields at different distances were measured simultaneously for 25 return strokes. Although the data is not enough, the distribution of peak current of the triggered strokes shows a probability of lognormal distribution. The geometric mean value was about 11.8 kA with a minimum of 5.8 kA and a maximum of 45.7 kA. The geometric mean of the 10-90% rise time was 1.9 μs, the geometric mean of the half peak width was 22.5 μs and the geometric mean of the charge transfer within 1 ms of return strokes was 0.7 C.
  • Keywords
    lightning; log normal distribution; AD 2005 to 2009; Binzhou; China; Shandong artificial triggering lightning experiment; charge transfer; discharge channel; discharge current; electromagnetic fields; geometric mean value; half peak width; lightning channel; lognormal distribution; natural lightning; negative return strokes; peak current; rocket-wire technique; triggered strokes; Clouds; Coils; Copper; Current measurement; Fault location; Lightning; Magnetic field measurement; Physics; Rockets; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475703
  • Filename
    5475703