DocumentCode :
2514472
Title :
The role of test in total quality management
Author :
Neblett, Bill
Author_Institution :
Defense Syst. & Electron. Group, Texas Instrum. Inc., Plano, TX, USA
fYear :
1994
fDate :
20-22 Sep 1994
Firstpage :
727
Lastpage :
735
Abstract :
The quality of a delivered product or system is ultimately limited by the quality of its design and manufacturing process. Defects that escape the design, manufacturing, and test processes are delivered to customers. Process Potential Index (Cp) and Process Capability Index (Cpk) are now widely used to express design and manufacturing quality. Design quality may be estimated from product models, if they exist, or measured using parametric test data. The difficulty in using test data is not so much in the calculations, but in the recording, storing, and selection of the data to be used in the calculations, This paper defines the metrics of quality estimation and describes an implementation of a system for estimating defect levels and process capabilities. The implementation includes the definition of a standardized parametric data exchange language for test data and an analytical system to standardize product quality measurement
Keywords :
automatic test software; automatic testing; data handling; electronic engineering computing; fault location; management; production testing; quality control; statistical process control; PDEL file structure; PDEL language; defect levels; design quality; manufacturing quality; metrics; parametric test data; process capabilities; process capability index; process potential index; product models; product quality measurement; quality estimation; standardized parametric data exchange language; total quality management; Customer satisfaction; Data analysis; Detectors; Government; Inspection; Instruments; Manufacturing processes; Process design; System testing; Total quality management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
Type :
conf
DOI :
10.1109/AUTEST.1994.381544
Filename :
381544
Link To Document :
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