DocumentCode
2514485
Title
Study of susceptibility of an MCU control system in the automotive field
Author
Wan, Fayu ; Duval, Fabrice ; Savatier, Xavier ; Louis, Anne ; Belahcene, Mazari
Author_Institution
IRSEEM, ESIGELEC Technopole clu Madrillet, St. Etienne du Rouvray, France
fYear
2010
fDate
12-16 April 2010
Firstpage
610
Lastpage
613
Abstract
This paper introduces a technique to detect the EMI environment of MCU relying on itself. The measurement setup is explained in detail. Furthermore, based on measurement, an output signal data library and susceptibility results are achieved. Finally, we present a technique which can detect disturbance and PMS (program multi-switching) system which can increase the reliability of MCU control DC Motor system and guarantee system speed. The final objective of the work is to develop software technique to increase the reliability of MCU system in the automotive field.
Keywords
DC motors; automobiles; control engineering computing; electromagnetic interference; DC motor system; EMI environment; MCU control system; automotive field; program multi-switching system; Automotive engineering; Computer displays; Control systems; Electromagnetic compatibility; Electromagnetic interference; Immunity testing; MATLAB; Oscilloscopes; Signal generators; Software libraries;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5621-5
Type
conf
DOI
10.1109/APEMC.2010.5475715
Filename
5475715
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