• DocumentCode
    2514485
  • Title

    Study of susceptibility of an MCU control system in the automotive field

  • Author

    Wan, Fayu ; Duval, Fabrice ; Savatier, Xavier ; Louis, Anne ; Belahcene, Mazari

  • Author_Institution
    IRSEEM, ESIGELEC Technopole clu Madrillet, St. Etienne du Rouvray, France
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    610
  • Lastpage
    613
  • Abstract
    This paper introduces a technique to detect the EMI environment of MCU relying on itself. The measurement setup is explained in detail. Furthermore, based on measurement, an output signal data library and susceptibility results are achieved. Finally, we present a technique which can detect disturbance and PMS (program multi-switching) system which can increase the reliability of MCU control DC Motor system and guarantee system speed. The final objective of the work is to develop software technique to increase the reliability of MCU system in the automotive field.
  • Keywords
    DC motors; automobiles; control engineering computing; electromagnetic interference; DC motor system; EMI environment; MCU control system; automotive field; program multi-switching system; Automotive engineering; Computer displays; Control systems; Electromagnetic compatibility; Electromagnetic interference; Immunity testing; MATLAB; Oscilloscopes; Signal generators; Software libraries;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475715
  • Filename
    5475715