• DocumentCode
    2514488
  • Title

    Single measurement testing, pros and cons

  • Author

    Miller, James R., III

  • Author_Institution
    US Army TDME Activity, Redstone Arsenal, AL, USA
  • fYear
    1994
  • fDate
    20-22 Sep 1994
  • Firstpage
    721
  • Lastpage
    725
  • Abstract
    There is a school of thought that believes making a single measurement of some parameter is a proper test procedure. For reasons of speed and the large number of measurements to be made on an item, so the reasoning goes, one cannot afford to make multiple measurements, calculate the average and the variation of the readings. What are the consequences of this approach? Can one test a unit to its specifications using this approach? What are the trade-offs inherent in single measurement testing? What happens if an erratic unit is tested? An alternative testing method involves taking a few repeat values, averaging them and estimating their repeatability. The same set of questions apply. The pros and cons of these two approaches are discussed. Practical real world examples are presented
  • Keywords
    automatic test equipment; automatic testing; electronic equipment testing; printed circuit testing; ATE; LRU; PCB testing; SRU; averaging; cons; line replaceable units; pros; repeat values; repeatability; shop replaceable units; single measurement testing; trade-offs; Aerospace testing; Automatic test equipment; Circuit testing; Educational institutions; Large-scale systems; Printed circuits; Software testing; System testing; Time measurement; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-1910-9
  • Type

    conf

  • DOI
    10.1109/AUTEST.1994.381545
  • Filename
    381545