DocumentCode :
2514488
Title :
Single measurement testing, pros and cons
Author :
Miller, James R., III
Author_Institution :
US Army TDME Activity, Redstone Arsenal, AL, USA
fYear :
1994
fDate :
20-22 Sep 1994
Firstpage :
721
Lastpage :
725
Abstract :
There is a school of thought that believes making a single measurement of some parameter is a proper test procedure. For reasons of speed and the large number of measurements to be made on an item, so the reasoning goes, one cannot afford to make multiple measurements, calculate the average and the variation of the readings. What are the consequences of this approach? Can one test a unit to its specifications using this approach? What are the trade-offs inherent in single measurement testing? What happens if an erratic unit is tested? An alternative testing method involves taking a few repeat values, averaging them and estimating their repeatability. The same set of questions apply. The pros and cons of these two approaches are discussed. Practical real world examples are presented
Keywords :
automatic test equipment; automatic testing; electronic equipment testing; printed circuit testing; ATE; LRU; PCB testing; SRU; averaging; cons; line replaceable units; pros; repeat values; repeatability; shop replaceable units; single measurement testing; trade-offs; Aerospace testing; Automatic test equipment; Circuit testing; Educational institutions; Large-scale systems; Printed circuits; Software testing; System testing; Time measurement; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
Type :
conf
DOI :
10.1109/AUTEST.1994.381545
Filename :
381545
Link To Document :
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