• DocumentCode
    2514600
  • Title

    A fast mechanism identification approach for radiated EMI using near field measurement

  • Author

    Zhao, Yang ; Yan, Wei ; Luo, Yongchao ; Li, Shijin ; Feng, Zhimin ; Rong, Rong ; Wen, Feng

  • Author_Institution
    Sch. of Electr. & Autom. Eng., Nanjing Normal Univ., Nanjing, China
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    259
  • Lastpage
    262
  • Abstract
    In the paper, a fast approach is proposed to identify the mechanism for radiated EMI using near field measurement. Equivalent radiation models have been set up to analyze radiated source, which include electric dipole (Common Mode) and magnetic dipole (Differential Mode). In near field region, according to wave impedance theory, mechanism of radiated noise can be identified and noise reduction methods could be adopted. Blue tooth communication and PCBs are investigated to validate the approach. The results show that noise from blue tooth is CM noise and noise reduces by 40% after noise suppression.
  • Keywords
    Bluetooth; electric impedance; electromagnetic interference; interference suppression; magnetic moments; printed circuits; Blue tooth communication; CM noise; PCB; common mode; differential mode; electric dipole; magnetic dipole; mechanism identification approach; near field measurement; near field region; noise reduction; noise suppression; radiated EMI; radiated noise; radiated source; wave impedance theory; Current measurement; Delta modulation; Electric variables measurement; Electromagnetic interference; Frequency measurement; Impedance measurement; Magnetic field measurement; Magnetic noise; Noise measurement; Noise reduction; Equivalent radiation model; Mechanism identification; Near field measurement; Radiated EMI; Wave impedance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475721
  • Filename
    5475721