DocumentCode
251481
Title
Estimating the transit time of an Aly Ga1−y As HBT in the Gaussian doped base region for low to moderately high level of injection
Author
Jahan, Nusrat ; Mannan, Rowshon Ara ; Biswas, Priyanka ; Arafat, Yeasir
Author_Institution
Dept. of Electr., Electron. & Commun. Eng., Dhaka, Bangladesh
fYear
2014
fDate
20-22 Dec. 2014
Firstpage
800
Lastpage
803
Abstract
For a Gaussian doped graded base AlGaAs Hetero-junction Bipolar Transistor (HBT), base transit time (BTT) has been determined using a suitable analytical model. Here the authors have investigated the dependency of base transit time on different physical and input parameters such as the collector current density, base emitter voltage etc. Electric field dependent carrier mobility also has been included into the analytic model and found that the base transit time worsens compared to the value found without taken the field dependent mobility into account.
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlyGa1-yAs; BTT; Gaussian doped base region; HBT; analytical model; base emitter voltage; base transit time estimation; collector current density; electric field dependent carrier mobility; heterojunction bipolar transistor; Current density; Doping; Electric fields; Heterojunction bipolar transistors; Junctions; Shape; Silicon germanium; Base transit time of AlGaAs HBT; Field dependent mobility; Gaussian doping; Graded base;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering (ICECE), 2014 International Conference on
Conference_Location
Dhaka
Print_ISBN
978-1-4799-4167-4
Type
conf
DOI
10.1109/ICECE.2014.7027024
Filename
7027024
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