• DocumentCode
    251481
  • Title

    Estimating the transit time of an AlyGa1−yAs HBT in the Gaussian doped base region for low to moderately high level of injection

  • Author

    Jahan, Nusrat ; Mannan, Rowshon Ara ; Biswas, Priyanka ; Arafat, Yeasir

  • Author_Institution
    Dept. of Electr., Electron. & Commun. Eng., Dhaka, Bangladesh
  • fYear
    2014
  • fDate
    20-22 Dec. 2014
  • Firstpage
    800
  • Lastpage
    803
  • Abstract
    For a Gaussian doped graded base AlGaAs Hetero-junction Bipolar Transistor (HBT), base transit time (BTT) has been determined using a suitable analytical model. Here the authors have investigated the dependency of base transit time on different physical and input parameters such as the collector current density, base emitter voltage etc. Electric field dependent carrier mobility also has been included into the analytic model and found that the base transit time worsens compared to the value found without taken the field dependent mobility into account.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlyGa1-yAs; BTT; Gaussian doped base region; HBT; analytical model; base emitter voltage; base transit time estimation; collector current density; electric field dependent carrier mobility; heterojunction bipolar transistor; Current density; Doping; Electric fields; Heterojunction bipolar transistors; Junctions; Shape; Silicon germanium; Base transit time of AlGaAs HBT; Field dependent mobility; Gaussian doping; Graded base;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering (ICECE), 2014 International Conference on
  • Conference_Location
    Dhaka
  • Print_ISBN
    978-1-4799-4167-4
  • Type

    conf

  • DOI
    10.1109/ICECE.2014.7027024
  • Filename
    7027024