DocumentCode :
2514824
Title :
Alteration of BBB tight junction protein expression induced by EMP exposure
Author :
Ding, Gui-Rong ; Qiu, Lian-Bo ; Li, Kang-Chu ; Wang, Xiao-Wu ; Zhou, Yong-Chun ; Zhou, Yan ; Liu, Jun-Ye ; Li, Yu-Rong ; Guo, Guo-Zhen
Author_Institution :
Dept. of Radiat. Med., Fourth Mil. Med. Univ., Xi´´an, China
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
374
Lastpage :
376
Abstract :
In this study, we examined the effects of exposure to electromagnetic pulse(EMP) on the functional integrity of the BBB and, on the expression of tight junction (TJ) protein (occludin, ZO-1) in rats. Animals were whole body exposed or sham exposed to EMP at 200 kV/m for 400 pulses. The permeability of BBB was examined using Evans Blue (EB) as vascular tracer. The expression of the level of TJ proteins were assessed by western blot. The data indicated that EMP exposure caused increased permeability of BBB and decreased levels of TJ protein ZO-1. These results suggested that the alteration of ZO-1 may play an important role in the disruption of tight junctions, which may lead to dysfunction of the BBB after EMP exposure.
Keywords :
bioelectric phenomena; biological effects of fields; blood vessels; molecular biophysics; neurophysiology; proteins; BBB functional integrity; BBB tight junction protein expression; EMP exposure effects; Evans Blue vascular tracer; ZO-1 protein; blood-brain barrier permeability; electromagnetic pulse; occludin; Animals; Biomembranes; Blood; Cerebral cortex; EMP radiation effects; Electromagnetic compatibility; Microscopy; Permeability; Proteins; Rats;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475732
Filename :
5475732
Link To Document :
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