DocumentCode
2514824
Title
Alteration of BBB tight junction protein expression induced by EMP exposure
Author
Ding, Gui-Rong ; Qiu, Lian-Bo ; Li, Kang-Chu ; Wang, Xiao-Wu ; Zhou, Yong-Chun ; Zhou, Yan ; Liu, Jun-Ye ; Li, Yu-Rong ; Guo, Guo-Zhen
Author_Institution
Dept. of Radiat. Med., Fourth Mil. Med. Univ., Xi´´an, China
fYear
2010
fDate
12-16 April 2010
Firstpage
374
Lastpage
376
Abstract
In this study, we examined the effects of exposure to electromagnetic pulse(EMP) on the functional integrity of the BBB and, on the expression of tight junction (TJ) protein (occludin, ZO-1) in rats. Animals were whole body exposed or sham exposed to EMP at 200 kV/m for 400 pulses. The permeability of BBB was examined using Evans Blue (EB) as vascular tracer. The expression of the level of TJ proteins were assessed by western blot. The data indicated that EMP exposure caused increased permeability of BBB and decreased levels of TJ protein ZO-1. These results suggested that the alteration of ZO-1 may play an important role in the disruption of tight junctions, which may lead to dysfunction of the BBB after EMP exposure.
Keywords
bioelectric phenomena; biological effects of fields; blood vessels; molecular biophysics; neurophysiology; proteins; BBB functional integrity; BBB tight junction protein expression; EMP exposure effects; Evans Blue vascular tracer; ZO-1 protein; blood-brain barrier permeability; electromagnetic pulse; occludin; Animals; Biomembranes; Blood; Cerebral cortex; EMP radiation effects; Electromagnetic compatibility; Microscopy; Permeability; Proteins; Rats;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5621-5
Type
conf
DOI
10.1109/APEMC.2010.5475732
Filename
5475732
Link To Document