Passive-intermodulation analysis between rough circular waveguide flanges using Weibull distribution

Author

Wang, X.B. ; Zhang, N. ; Hu, T.C. ; Sun, Q.F. ; Cui, W.Z. ; Ye, M. ; He, Y.N.

Author_Institution

Nat. Key Lab. of Sci. & Technol. on Space Microwave Technol., Inst. of Space Radio Technol., Xi´´an, China

fYear

2010

fDate

12-16 April 2010

Firstpage

1442

Lastpage

1445

Abstract

In this paper, the Weibull distribution is employed to characterise the surface topography in the analysis of the passive intermodulation (PIM) between rough circular waveguide flanges, where the PIM level as a function of different system parameters such as the applied pressure, roughness, layer thickness and the power ratio has been developed assuming that the PIM level for a particular set of parameters is known. The proposed method is more significant when the contact surface needs to be described by parameters like the skewness or the kurtosis.

Keywords

Weibull distribution; circular waveguides; intermodulation; Weibull distribution; contact surface; passive-intermodulation analysis; rough circular waveguide flanges; surface topography; Electromagnetic waveguides; Flanges; Microwave technology; Rectangular waveguides; Rough surfaces; Space technology; Surface roughness; Surface topography; Surface waves; Weibull distribution; Gaussian distribution; Passive intermodulation; Taylor expansion; Weibull distribution; circular waveguide; nonlinearities;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on

Conference_Location

Beijing

Print_ISBN

978-1-4244-5621-5

Type

conf

DOI

10.1109/APEMC.2010.5475733

Filename

5475733