• DocumentCode
    2515018
  • Title

    Re-engineering the test development process

  • Author

    Giordano, Paul J. ; Levy, Ford

  • Author_Institution
    Giordano Automation Corp., Sparta, NJ, USA
  • fYear
    1994
  • fDate
    20-22 Sep 1994
  • Firstpage
    527
  • Lastpage
    535
  • Abstract
    Traditional development of the diagnostic portion of test programs required a highly labor-intensive process of going through pages of schematics and circuit diagrams, hypothesizing all potential failure modes, and developing discrete test paths to ensure fault propagation. In the re-engineered test process, model-based diagnostic software is separated from test software. In run-time, the diagnostic software provides dynamic fault isolation without complex diagnostic test programs. In the re-engineered test process, the fundamental nature and structure of the test process has been changed. The interpretation of the tests is done by dynamic interaction of the product or process knowledge base with an Al Inference Engine that on-the-fly interprets test information based upon all information it receives-in any order. In this type of test program structure, no code is duplicated. The fist of faults is clearly identified and diagnostic data for each fault is kept in one location. Model-based reasoning makes diagnostics affordable for limited production testing and effective for complex system test. The re-engineered test process also supports design of embedded fault management systems, trade-offs between on-line and off-line test, as well as automatic production and field service diagnostics
  • Keywords
    automatic test software; knowledge based systems; model-based reasoning; real-time systems; software development management; ATE; Al Inference Engine; automatic production diagnostics; complex system test; dynamic fault isolation; dynamic interaction; field service diagnostics; limited production testing; model-based diagnostic software; model-based reasoning; re-engineered test process; test development process; test software; Automatic testing; Circuit faults; Circuit testing; Engines; Fault diagnosis; Inference mechanisms; Production systems; Runtime; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-1910-9
  • Type

    conf

  • DOI
    10.1109/AUTEST.1994.381573
  • Filename
    381573