DocumentCode
2515018
Title
Re-engineering the test development process
Author
Giordano, Paul J. ; Levy, Ford
Author_Institution
Giordano Automation Corp., Sparta, NJ, USA
fYear
1994
fDate
20-22 Sep 1994
Firstpage
527
Lastpage
535
Abstract
Traditional development of the diagnostic portion of test programs required a highly labor-intensive process of going through pages of schematics and circuit diagrams, hypothesizing all potential failure modes, and developing discrete test paths to ensure fault propagation. In the re-engineered test process, model-based diagnostic software is separated from test software. In run-time, the diagnostic software provides dynamic fault isolation without complex diagnostic test programs. In the re-engineered test process, the fundamental nature and structure of the test process has been changed. The interpretation of the tests is done by dynamic interaction of the product or process knowledge base with an Al Inference Engine that on-the-fly interprets test information based upon all information it receives-in any order. In this type of test program structure, no code is duplicated. The fist of faults is clearly identified and diagnostic data for each fault is kept in one location. Model-based reasoning makes diagnostics affordable for limited production testing and effective for complex system test. The re-engineered test process also supports design of embedded fault management systems, trade-offs between on-line and off-line test, as well as automatic production and field service diagnostics
Keywords
automatic test software; knowledge based systems; model-based reasoning; real-time systems; software development management; ATE; Al Inference Engine; automatic production diagnostics; complex system test; dynamic fault isolation; dynamic interaction; field service diagnostics; limited production testing; model-based diagnostic software; model-based reasoning; re-engineered test process; test development process; test software; Automatic testing; Circuit faults; Circuit testing; Engines; Fault diagnosis; Inference mechanisms; Production systems; Runtime; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-1910-9
Type
conf
DOI
10.1109/AUTEST.1994.381573
Filename
381573
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