Title :
An examination of several large signal capacitance models to predict GaAs HEMT linear power amplifier performance
Author :
Staudinger, J. ; De Baca, M.C. ; Vaitkus, R.
Author_Institution :
Semicond. Products Sector, Motorola Inc., Tempe, AZ, USA
Abstract :
This article examines several methods of modeling the charge/capacitance characteristics of GaAs HEMT devices for use in large signal models applied to the design and simulation of linear power amplifiers. Emphasis is placed on the effect these charge/capacitance models exhibit on the accuracy of the large signal model to predict linear power amplifier characteristics including gain, output power, efficiency, and linearity. Model predictions are contrasted to on-wafer load pull measurements made using a single-tone sinusoid, two-tone sinusoid, and a π/4 DQPSK stimuli compliant to the NADC standard. The results suggest the description of the device´s charge/capacitance characteristics significantly effects large signal model accuracy
Keywords :
HEMT circuits; III-V semiconductors; capacitance; cellular radio; circuit simulation; digital radio; gallium arsenide; power amplifiers; radiofrequency amplifiers; semiconductor device models; π/4 DQPSK stimuli; GaAs; HEMT linear power amplifier performance; III V semiconductors; NADC standard; amplifier design; charge/capacitance characteristics; digital cellular systems; efficiency; gain; large signal capacitance models; on-wafer load pull measurements; output power; simulation; single-tone sinusoid; two-tone sinusoid; Capacitance; Capacitance-voltage characteristics; Gallium arsenide; HEMTs; Linearity; Measurement standards; Power amplifiers; Power generation; Predictive models; Signal design;
Conference_Titel :
Radio and Wireless Conference, 1998. RAWCON 98. 1998 IEEE
Conference_Location :
Colorado Springs, CO
Print_ISBN :
0-7803-4988-1
DOI :
10.1109/RAWCON.1998.709207